I.C. Testing & Conditioning

Programmable Devices Inc. can provide component testing to Military, Commercial or Industrial specifications. Extended services include CCAP101 & AS6081 remove Aerospace levels, DPA and Failure Analysis. Or, allow us to design a reliability program for you.

Data Retention Testing for memory devices is the service of cycling the programming and verification functions, testing for intermittent bit failure. In house services support component authenticity inspection through De-cap and die analysis containing a full pictured report.

We support the following test methods and procedures for microelectronics:

  • MIL-STD-883B
  • MIL-STD-750
  • AS6081
  • CCAP101
  • MIL-STD-45662
  • EIA STD-481-E
  • JDEC J-STD003B
  • Stabilization Bake
  • Functional Go / No Go
  • Memory Access Time Testing
  • Industrial Temperature Screening

Contact Programmable Devices Inc. today to learn more about our device testing and conditioning services by calling 978-750-9800 or submitting an inquiry via our web form.

Programmable Devices Inc. of Danvers, MA provides component testing and device conditioning services, authenticity inspection and other value-added services for component distributors, manufacturers and contractors throughout the United States and Europe.

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Exceptional Component Programming & Testing Services

Contact the experts with Programmable Devices Inc. today for more information about our extensive range of component management services.

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