I.C. Testing & Conditioning
Programmable Devices Inc. can provide component testing to Military, Commercial or Industrial specifications. Extended services include Aerospace levels, DPA and Failure Analysis. Or, allow us to design a reliability program for you.
Data Retention Testing for memory devices is the service of cycling the programming and verification functions, testing for intermittent bit failure. Extended services include component authenticity inspection through de-cap and die analysis containing a full pictured report.
We support the following test methods and procedures for microelectronics:
- Stabilization Bake
- Functional Go / No Go
- Memory Access Time Testing
- Industrial Temperature Screening
Contact Programmable Devices Inc. today to learn more about our device testing and conditioning services by calling 978-750-9800 or submitting an inquiry via our web form.